Laser Optics Instrumentation (OPTOLAS)

OPTOLAS includes a wide range of lasers, bench of characterization of optical radiations or optical materials and advanced imaging systems. The platform also proposes instruments and systems adapted for laser beam or short pulse shaping.

• Amplifiers and sources for advanced laser instrumentation
• Instruments and benches of characterization of optical radiations or optical materials
• Advanced imaging systems
• Instruments or systems for laser beam or short pulse shaping

Amplifiers and sources for advanced laser instrumentation

OPTOLAS manages several oscillators and amplifiers operating in different spectral and temporal ranges:

• Femtosecond Oscillators

                              - Wide bandwidth and wavelength agility (Dl=10nm; Dt=100fs; @0.7µm-1µm)

                              - Ultra-wide bandwidth (Dl=100nm; Dt=10fs; @0.8µm)

                              - Compact (Dl=7nm; Dt=180fs; @1.03µm)

• Picosecond Oscillators

                              - Amplified, telecom central wavelength

                              - Tunable by OPG from the visible to the mid-infrared

• Nanosecond and sub-nanosecond oscillators @ 1064nm
• White-light continuum from visible to near infrared in sub-nanosecond operating regime
• High coherence telecom sources (Dn<1kHz)

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Instruments and benches of characterization of optical radiations or optical materials

Several benches of characterization have been developed for the use of the research teams of the photonics department and can be accessible through OPTOLAS. Some of them are versatile enough to be adapted to the needs of other users.

• SPIRIT – « Spectral interferometry resolved in time » a coherent femtosecond pulse measurement bench (10 fs – 100 nm)
• Measurement of nonlinear response (excitation 0.7µm-1µm; detection 0.3µm-0.9µm)
• Module of dispersion compensation up to the third order over a broadband around 800nm.

Beyond characterization benches, scientific instruments complete the specific means of characterizing the light within the platform.

• Field and intensity autocorrelators from 0.7µm to 1.9µm

• Photon counting detector
• Polarimeter

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Advanced imaging systems

OPTOLAS includes microscopes which can be coupled to different laser sources. OPTOLAS offers service of high performance instruments for spatial analysis of laser beam with different kinds of cameras and wavefront analyzer.

• Multi-photon confocal microscope  
• Multimodal inverted microscope (Olympus IX71)  (fluorescence, phase contrast, polarization)
• Raman microscope
• Shack-Hartmann  wavefront analyzer (visible – near infrared)
• High resolution, high dynamic or fast cameras

OPTOLAS has different high resolution imaging benches more specifically dedicated to astronomy. They include:

• Configurable simulator of discrete luminous objects
• Array of configurable antennas
• Direct or indirect imagery systems
• Standard detectors or hybrid detectors using sum frequency generation SFG
• data processing modules to provide observable quantity (contrast, closure phase)

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Instruments or systems for laser beam or short pulse shaping

OPTOLAS proposes devices or components suitable for spatial, spectral or temporal laser beam shaping.

• Femto Shaper – short pulse profiling (sub-picosecond from visible to near infrared)

• Spatial light modulators of high resolution

               - 2D phase only component operating in reflection (1920x1080 pixels, 8µm pitch, 2p @ 1µm)

               - 1D phase and amplitude component operating in transmission (640 pixels)

• Deformable mirror using 140 actuators (400µm pitch, 5,5µm stroke)

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